XAFS for Everyone

Scott (Lehman College Calvin


Engels | 27-08-2026 | 444 pagina's

9780367345679

Paperback / softback


75,00

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This second edition now includes chapters on spatial and temporal resolution, alternative measurement modes including resonant inelastic x-ray scattering (RIXS) and high-energy resolution fluorescence detection (HERFD), and an expanded chapter on experimental design.

Details

EAN :9780367345679
Auteur : 
Uitgever :Van Ditmar Boekenimport B.V.
Publicatie datum :  27-08-2026
Uitvoering :Paperback / softback
Taal/Talen : Engels
Status :Nog niet beschikbaar
Aantal pagina's :444