XAFS for Everyone
Scott (Lehman College Calvin
English | 27-08-2026 | 444 pages
9780367345679
Paperback / softback
75,00
Not yet available, available on 27/08/2026
Product store stocks
Flap / cover copy
This second edition now includes chapters on spatial and temporal resolution, alternative measurement modes including resonant inelastic x-ray scattering (RIXS) and high-energy resolution fluorescence detection (HERFD), and an expanded chapter on experimental design.
Details
| EAN : | 9780367345679 |
| Editeur : | Van Ditmar Boekenimport B.V. |
| Publication date : | 27-08-2026 |
| Format : | Paperback / softback |
| common.Language : | English |
| Stock : | Not yet available |
| Pages number : | 444 |